E1 set Immunity Development System
Short description
The E1 is a set of EMC tools used for EMI suppression in printed circuit boards during the development phase. The developer can use the E1 set to quickly identify the causes of burst and ESD interference. This allows the developer to design suitable measures to solve the causes of the interference. It can also be used to test the effectiveness of the measures taken. The E1 test set-up is small and fits easily on a developer’s desk. The E1 set user manual describes EMC mechanisms and provides detailed descriptions of basic measuring strategies for interference suppression in printed circuit boards. The E1 set includes a generator to generate burst and ESD disturbances.
Scope of delivery
- 1xSGZ 21, Burst Generator
- 1xS21, Optical Sensor (10 Mbps)
- 1xBS 02, Magnetic Field Source
- 1xBS 04DB, Magnetic Field Source
- 1xBS 05D, Magnetic Field Source
- 1xBS 05DU, Magnetic Field Source
- 1xES 00, E-Field Source
- 1xES 01, E-Field Source
- 1xES 02, E-Field Source
- 1xES 05D, E-Field Source
- 1xES 08D, E-Field Source
- 1xMS 02, Magnetic Field Probe
- 1xE1 acc, Accessories
- 1xNT FRI EU, Power Supply Unit
- 1xE1 case, System Case
- 1xE1 m, E1 Set User Manual
Recommended products
Technical parameters
| S21 optical sensor | |
| Transmission range | DC…10 Mbps |
| Optical fibre connector | 2.2 mm Ø |
| Supply voltage | (3-5) V |
| Current input | 10 mA |
| SGZ 21 burst Generator | |
| Pulse parameter | |
| Rise time | ca. 2 ns |
| Tail time | ca. 10 ns |
| Peak values | ca. 0…1500 V |
| Optical input | |
| Optical fiber | 2.2 mm |
| Max. frequency | 5 MHz |
| Min. pulse width | 100 ns |
| Supply voltage | 12 V / 200 mA |
| Sizes (L x W x H) | (154 x 100 x 62) mm |
| Measuring principles |  |
Scope of delivery details
SGZ 21
Burst Generator
The SGZ 21 burst generator generates floating, pulse shaped disturbance. Its outputs are seperated symmetrically and galvanically. SGZ 21 can be partially coupled to constructional parts, cables, shieldings, ground connections; directly in assemblies or indirectly via field sources of a device under…
S21
Optical Sensor (10 Mbps)
The S21 sensor is a digital probe for nonreactive transmissions of binary signals out of the device under test during a burst testing. The sensor is positioned directly onto the PC board of the device under test and is powered by the device under test. In the sensor the digital signal is transformed…
BS 02
Magnetic Field Source
The BS 02 magnetic field source is designed for localizing weak spots in the layout. It generates a B field bundle of > 5 cm in diameter and is suitable for extensive pulsing of housing surfaces and internal areas, connection technology and assemblies with conducting path structures and ICs. It det…
BS 04DB
Magnetic Field Source
The BS 04DB generates a B field bundle in millimeter range and is specially designed to localize critical parts of conducting paths, components and component connectors. The field which emits from the field soures head is guided above the device under test.
BS 05D
Magnetic Field Source
The BS 05D generates a B field with a diameter > 3 mm. The field lines run at 90° to the field source. The field source is specially suitable for localizing weak spots between two printed circuit boards and in hard to reach spots of assemblies, e.g. between components. Before using the BS 05D, the w…
BS 05DU
Magnetic Field Source
The BS 05DU generates a magnetic field in millimeter range. It functions like a couppling clamp and is used for selective coupling of disturbance current in single conducting paths, IC pins, SMD components and thin cables (flat ribbon cables).
ES 00
E-Field Source
ES 00 allows electric couplings, which are either large (150 cm²) or with the edge of the field source head also linear. E field sensitive weak spots often range extensively over 10 to 15 cm (LCD display; bus systems). Large field sources like ES 00 detect such weak spots. ES 00 can also be used fo…
ES 01
E-Field Source
The field source is suitable for pulsing planar or line shaped weak points in the range from 5 to 10 cm. It ranges between the field source ES 02 and ES 00. ES 01 can also be used for coupling disturbance current into assemblies.
ES 02
E-Field Source
The surface of the E field source head allows the extensive coupling into housing surfaces and interior areas, connection technology and assemblies with conducting path structures and ICs ( e.g. bus systems, LCD displays). Furthermore its tip can be used for the localization of small E- field sensit…
ES 05D
E-Field Source
The E field source has a small line shaped coupling electrode in its field source head. Therefore it is suitable for positioning on conducting paths, small components and their connectors, wires and singe SMD components like resistors and capacitors. Single male contacts or cores of flat ribbon cabl…
ES 08D
E-Field Source
The ES 08D E field source is a probe tip, which is used to determine the sensibility of an IC pin or a conductor. During the test the probe tip is bonded with the pin / conducting path. By changing the intenstity of the burst impulse at SGZ 21 the sensitivity of the pin is determined.
MS 02
Magnetic Field Probe
The magnetic field probe is designed for measuring bust magnetic fields within the device under test. The paths of the disturbance current can be detected. The MS 02 magnetic field probe is used together with SGZ 21.